Resolution Enhancement in Recent Spherical Aberration Corrected High-resolution Transmission Electron Microscopy
نویسندگان
چکیده
منابع مشابه
High-resolution transmission electron microscopy using negative spherical aberration.
A novel imaging mode for high-resolution transmission electron microscopy is described. It is based on the adjustment of a negative value of the spherical aberration C S of the objective lens of a transmission electron microscope equipped with a multipole aberration corrector system. Negative spherical aberration applied together with an overfocus yields high-resolution images with bright-atom ...
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SiO2/Si(100) interfaces were for the first time observed by a spherical aberration-corrected high-resolution transmission electron microscope in a cross-sectional mode. As the Fresnel fringes were not contrasted at the interfaces, the interfacial structures were clearly observed without the need for artificial image contrast. Atomic steps and defects on the Si(100) surfaces were accurately iden...
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Aberration-corrected transmission electron microscopy allows us to image the structure of matter at genuine atomic resolution. A prominent role for the imaging of crystalline samples is played by the negative spherical aberration imaging (NCSI) technique. The physical background of this technique is reviewed. The especially high contrast observed under these conditions owes its origin to an enh...
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ژورنال
عنوان ژورنال: Nihon Kessho Gakkaishi
سال: 2005
ISSN: 0369-4585,1884-5576
DOI: 10.5940/jcrsj.47.20